Lifetime Test of 1.3μm InGaAsP/lnP DC-PBH Lasers

Wang Yuzhang Huan Kaiping Zhao Junying

doi:10.13756/j.gtxyj.1990.03.006

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Lifetime Test of 1.3μm InGaAsP/lnP DC-PBH Lasers

- Lifetime Test of 1.3μm InGaAsP/lnP DC-PBH Lasers
- Study on Optical communication Issue 3, Pages: 41-50(1990)
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- DOI：10.13756/j.gtxyj.1990.03.006
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- Published：1990，
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[1]王玉章,黄开平,赵俊英.1.3μm InGaAsP/InP DC-PBH型激光器件寿命试验[J].光通信研究,1990(03):41-50.

Wang Yuzhang Huan Kaiping Zhao Junying. Lifetime Test of 1.3μm InGaAsP/lnP DC-PBH Lasers. [J]. (3):41-50(1990)
[1]王玉章,黄开平,赵俊英.1.3μm InGaAsP/InP DC-PBH型激光器件寿命试验[J].光通信研究,1990(03):41-50. DOI： 10.13756/j.gtxyj.1990.03.006.

Wang Yuzhang Huan Kaiping Zhao Junying. Lifetime Test of 1.3μm InGaAsP/lnP DC-PBH Lasers. [J]. (3):41-50(1990) DOI： 10.13756/j.gtxyj.1990.03.006.

摘要

本文叙述了光纤通信中用作光源的半导体激光器寿命试验情况。实验是以DC-PBH型结构1.3μm激光管为对象

在高温下进行加速寿命试验

试验过程中均未出现偶然失效现象.其外推室温寿命MTTF值为2.6×10

小时（σ=1.06）

并给出了失效率λ（t）与时间t的关系曲线

以备通信系统工程设计查用。

Abstract

Lifetest of semiconductor lasers used as light source in fiber-optic communications is described in detail.DC-PBH lasers were used for our experiment

which undertook the high temperature atmospherewith high stress to accelarate the lifetest. No random failure phenomena were observed throughout the experiment. According to the results from the experiment

the lasers’extrapolated MTTF is 2.6×10

hrs（σ=1.06） and failure rate λ（t） vs. time t relations are also given for the purpose of the engineering design of fiber-optic communications.

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