The chip of the four-quadrant InGaAs APD in this paper is designed in a frontal incident planar structure and its material part is an SAGM APD.On the basis of systematical analysis and calculation of its important parameters
such as response time
dark current and responsivity
the optimized structural and the technological parameters are given.The test results show that its response time is ≤1.5 ns
responsivity ≥9.5 A/W and dark current ≤40 nA.As the PN junction and multiplication layer are set under the surface of the device in the reliability design
the surface leakage current can be effectively restrained and the reliability of the device improved.
关键词
InGaAs雪崩光电二极管吸收区倍增区渐变分离-雪崩光电二极管光谱响应范围响应度暗电流
Keywords
InGaAs APDSAGM-APDspectrum response rangeresponsivityDark current