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Research on the high-reliability mechanism of carrier-level Ethernet links
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    • Research on the high-reliability mechanism of carrier-level Ethernet links

    • Study on Optical communication   Issue 2, Pages: 19-21(2009)

    • DOI：10.13756/j.gtxyj.2009.02.020    

      CLC： TN915

    • Published：2009，

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  • Zheng Yuan1, Lu Siqing2, Dong Ximing1. Research on the high-reliability mechanism of carrier-level Ethernet links. [J]. (2):19-21(2009) DOI： 10.13756/j.gtxyj.2009.02.020.

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The Fifth Electronics Research Institute of the Ministry of Industry and Information Technology
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