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A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity
    • A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity

    • Study on Optical communication   Issue 2, Pages: 50-56(2020)
    • DOI:10.13756/j.gtxyj.2020.02.011    

      CLC: O484.5;TP212
    • Published:2020,

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  • ZHANG Shu-e, YU Xing-yuan. A Method for Measuring the Thickness of Dielectric Thin Films on the Inner Wall of a Cylindrical Cavity. [J]. (2):50-56(2020) DOI: 10.13756/j.gtxyj.2020.02.011.

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