TONG Jian-nong, ZOU Xue-cheng, SHEN Xu-bang. Finite element error analysis for Boltzmann transport model[J]. 2004,(4):64-66. DOI: 10.13756/j.gtxyj.2004.04.021.
The finite element error analysis using Boltzmann modeling MOSFET is investigated. The physics and modeling indicate that the disturbed errors come from the refine mesh of FEA.
关键词
有限元方法误差分析纵向MOSFETSOI
Keywords
finite element analysiserror analysisvertical nMOSFETSOI