This paper presents a bilinear temperature compensator structure which based on the Arrayed Waveguide Grating（AWG） chips for the forward load-carrying technology of 5 G. The device composed of multiple drivers

which makes chips have different relative displacement and effective compensation in different temperature range. Temperature characteristic experiment is conducted to analyze the variation of central wavelength. The result shows that the wavelength offset during-40～ 85 ℃ can be achieved in 40 pm by using compensation device.In addition

the existing commercial devices are suitable for industrial environment and have achieved industrialization by measuring the insertion damage

offset and bandwidth of each channel before and after high temperature and high humidity reliability experiments.